Call For Papers

Download: Call for Papers


Please submit your camera-ready paper and IEEE Copyright Form here!

Prospective authors are cordially invited to submit original papers using the electronic submission system at the Symposium web page. Papers in English with a length of 6 pages maximum in IEEE conference style are expected. Specialized student and industrial sessions, as well as embedded tutorials, will be organized at the symposium. Accepted papers will be included in the Symposium Proceedings and submitted for inclusion into IEEE Xplore as well as other Abstracting and Indexing (A&I) databases.

Topics of interest

Topics of interest include but are not limited to:

  • SoC and NoC Design and Test
  • Design and Test in Nano-Technologies
  • ASIC/FPGA Design
  • Analog, Mixed-Signal, RF Design and Test
  • Built-in Self-Test and Self-Repair
  • ATE Hardware and Software
  • Bio-Inspired Hardware
  • Design for Testability and Diagnosis
  • Design Verification/Validation
  • On-line Testing
  • Formal Methods in System Design
  • Embedded Systems Testing
  • Hardware/Software Co-Design
  • Memory, Processor Testing
  • IP-based Design
  • MEMS Testing
  • Logic Synthesis
  • Physical Design
  • Defect/Fault Tolerance and Reliability
  • Dependable HW/SW Systems


This event is organized by IHP (Innovations for High Performance Microelectronics).